New jitter analysis and clock data recovery options for Rohde & Schwarz RTO Oscilloscope

New jitter analysis and clock data recovery options for Rohde & Schwarz RTO Oscilloscope

Published: 24th May 2013

When developing circuits with serial high-speed data interfaces such as USB 2.0 and HDMI, jitter measurements are important. One challenge is the signal's embedded clock, used as a time reference. Rohde & Schwarz have addressed this with new options for the RTO high-performance oscilloscope.

To measure signal integrity reliably, developers need a powerful T&M instrument. The RTO features an impressive low-noise frontend, high dynamic range ADC, high acquisition and analysis rate and a digital trigger system with extremely low trigger jitter.

As well as automatic jitter measurements, the new RTO-K12 jitter analysis option offers a large range of intelligent functions. For example: A wizard-driven menu helps users with the most important measurements in order to obtain quick results. Configurable software clock data recovery (CDR) was implemented for the automatic time interval error (TIE) measurement function. The track function shows the progression of measured values and their time correlation with the trace, opening up further analysis options. Geometric box elements help users quickly create mask tests.

The new RTO-K13 option’s configurable hardware CDR is integrated into the oscilloscope’s ASIC. This fully-integrated solution is the first to enable you to perform realtime triggering and signal analysis based on the embedded clock. Signal integrity on serial high-speed interfaces can be analysed at a speed of up to 5 Gbps. Histograms and mask tests return reliable results quickly.

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