New technology from LitePoint brings Speed & Quality Improvements to Wireless Device Manufacturing

New technology from LitePoint brings Speed & Quality Improvements to Wireless Device Manufacturing

Published: 3rd March 2015

LitePoint has announced new, advanced functionality for its cellular and connectivity products, designed to significantly increase manufacturing efficiency and throughput.

LitePoint Factory Efficiency tools are wireless test system options designed specifically to alert a test operator of issues before they impact the line, and save time and labour related to daily maintenance.

As demonstrated in customer deployments, these features can enable a test station to deliver a larger volume of devices, resulting in getting more wireless devices to market faster while reducing capital costs and factory floor space.

The Factory Efficiency solution will be showcased this week at Mobile World Congress in Barcelona, in the LitePoint Demo Lounge.

Curt Schmidek, Vice President of Marketing at LitePoint, said, “These innovative Factory Efficiency tools extend the capabilities of both of our industry leading IQxstream cellular and IQxel-M connectivity test platforms by enabling a host of new functionality geared toward increasing the speed and quality of production testing of wireless devices.”

Factory Efficiency tools enable three key improvements for testing wireless devices in high-volume production environments:

Fixture Health Check

Fixture Health Check increases the up-time of each test station by detecting wear-and-tear or other signal integrity problems between the tester and the device under test before these faults result in yield or test quality issues. If a problem with a test setup is detected, the factory operator is immediately notified that test station maintenance is required, and also indicates which tester connection has the fault … potentially saving several hours of lost productivity due to poor test yield and test station troubleshooting.

DUT Sense

A common cause of test failure in the factory is a poor connection to the antenna(s) of the device being tested (DUT) when the device is placed in the test fixture incorrectly. This costs time and can result in false failures. DUT Sense detects these types of failures and alerts you immediately if the device being tested is not properly set in the fixture.

Automatic Path Loss Calibration

Automatic Path Loss Calibration can reduce the standard test station calibration times from minutes down to seconds, and eliminates the requirement for costly external measurement equipment and specialised operators. This enables an entire factory floor of test stations to be calibrated at the same time, saving time, labour, and calibration equipment cost.

You Might also like

4200 Kiethley

How to Measure a MOSFET I-V Curve

One of the best ways to ensure a MOSFET is functioning properly and meets specifications is to determine its characteristics by tracing I-V curves. There are a number of output characteristics requiring I-V tests; you can derive gate leakage, breakdown voltage, threshold voltage, transfer characteristics, and drain current all by simply tracing I-V characteristics and verifying the device is working as it should.

Read more
DPO7 OE1 Tek RT 129 500px

MSO/DPO70000 & DPO70000SX are now Available with Enhanced Capabilities & Features Included as Standard

Tektronix class leading High Performance Oscilloscopes are now available with enhanced capabilities and features included as standard. Tektronix DPO/ MSO 12.5GHZ – 33GHZ C, DX and SX models come with additional enhancements at no additional cost when purchasing a new instrument.

Read more
TEM Cells

A Guide to Switch Considerations - Digital Switching

High speed digital signals exhibit RF behavior in real-world devices, which creates a need for RF or microwave components when routing these signals in test systems.

Read more

Sign up for the MCS Newsletter

You will receive all the latest test & measurement news and rental offers.