Tektronix DSA8300 Digital Serial Analyser Oscilloscope

425 fs Typical on up to 8 Simultaneously Acquired Channels
<100 fs on up to 6 Channels with 82A04B Phase Reference Module

With intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155 Mb/sec to 400G PAM4.

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Tektronix DSA8300 Digital Serial Analyser Oscilloscope Product Description

With intrinsic jitter of less than 100 femtoseconds for extremely accurate device characterization, the DSA8300 provides comprehensive support for Optical Communications Standards, Time Domain Reflectometry and S-parameters. The DSA8300 Digital Sampling Oscilloscope is a complete high-speed PHY Layer testing platform for data communications from 155 Mb/sec to 400G PAM4.

Key features

  • Up to 6 channels simultaneous acquisition at <100 fs jitter in a single mainframe.
  • Optical modules support optical compliance test of all standard rates from 155 Mb/s to 100 Gb/s (4x25) Ethernet.
  • Superior acquisition throughput with up to 300 kS/s maximum sample rate.
  • Ability to place the samplers adjacent to the device under test (DUT).
  • Independent calibrated channel de-skew.

Benefits

  • Minimizes the amount of instrumentation noise when acquiring high bit-rate, low-amplitude signals to eliminate additional noise which can exhibit itself as additional jitter and eye closure.
  • High fidelity acquisition of multiple differential channels enables testing for cross channel impairments and improves the test throughput for systems with multiple high-speed serial channels.
  • Remote sampling heads minimize signal degradation due to cabling and fixturing from DUT to instrumentation and simplifies test system de-embed.
  • Having integrated, calibrated channel deskew in dual channel modules, enhances signal fidelity for multi-channel measurements by eliminating skewing.

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