Tektronix BSX BERTScope® Bit Error Rate Tester Series

Single Solution for Receiver Stress Testing, Debug and Compliance

The BERTScope BSX-series Bit Error Rate Tester introduces a receiver test platform capable of supporting emerging Gen4 standards and beyond. With the addition of powerful data processing and internal Tx equalization, the BERTScope supports protocol-based handshaking and synchronization with your device under test (DUT), including interactive link training at data rates up to 32 Gb/s. The BSX-series shortens the time to debug physical layer and link training issues, and provides the quickest path to compliance for a broad range of standards.

Model
Channels
Max Data Rate
Sequencer States
 
BSX320

1

32 Gb/s

128/2

BSX240

1

24 Gb/s

128/2

BSX125

1

12.5 Gb/s

128/2

Tektronix BSX BERTScope® Bit Error Rate Tester Series Product Description

The BERTScope BSX-series Bit Error Rate Tester introduces a receiver test platform capable of supporting emerging Gen4 standards and beyond. With the addition of powerful data processing and internal Tx equalization, the BERTScope supports protocol-based handshaking and synchronization with your device under test (DUT), including interactive link training at data rates up to 32 Gb/s. The BSX-series shortens the time to debug physical layer and link training issues, and provides the quickest path to compliance for a broad range of standards.

Key performance specifications

  • Pattern Generation and Error Analysis up to 32 Gb/s
  • Optional built-in 4-tap Tx equalization with support for interactive link training
  • Protocol-oriented and bit-oriented multi-chain pattern sequencing with enhanced pattern/sequence editor
  • User-defined detector pattern matching with stimulus-response feedback
  • Patented Error Location Analysis™ goes beyond BER measurement to provide insight into the sources of errors through analysis of correlations and deterministic error patterns
  • Optional Forward Error Correction analysis provides for simulation of post-FEC error rate based upon measured error location patterns
  • Integrated Eye Diagram Analysis with BER Correlation including Mask Testing, Jitter Peak, BER Contour
  • Optional Jitter Map Comprehensive Jitter Decomposition - with Long Pattern (i.e. PRBS-31) Jitter

Key features

  • Provides a single solution for Receiver stress testing, debug and compliance
  • Test Gen3 and Gen4 standards including PCIe, SAS, and USB3.1 and proprietary standards
  • DUT handshaking capability above16 Gb/s supporting RX test requirements for loopback initiation and adaptive link training for key standards such as PCIe
  • Protocol-aware pattern generation and error detection supports flexible stimulus response programmability and debugging of handshaking issues.
  • Forward error correction (FEC) emulation option supports measurement of BER both before and after error correction for commonly used Reed-Solomon FEC codes.
  • Calibration and test automation software available for key standards

Tektronix BSX BERTScope® Bit Error Rate Tester Series Resources

Datasheets

User Manual(s)

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