Semiconductor Parameter Analysers
The semiconductor parameter analyser is a test instrument that integrates multiple measurement and analysis capabilities to perform the current‐voltage (IV) and capacitance measurement (CV (capacitance‐ voltage), C‐f (capacitance frequency), and C‐t (capacitance-time)) measurements accurately and those analyses quickly and easily in a box for the semiconductor parametric test.
Keithley 4200A-SCS Parameter Analyser
±210 V/100 mA or ±210 V/1 A Modules, 100 fA Measure Resolution
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Accelerate research, reliability and failure analysis studies of semiconductor devices, materials and process development with the 4200A-SCS.